Bernstein J. Reliability Prediction for Microelectronics 2024

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Bernstein J. Reliability Prediction for Microelectronics 2024 (Size: 31.59 MB)
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Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over the lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability

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