| dlfeb.com.Electromigration.Inside.Logic.Cells.Modeling.Analyzing.and.Mitigating.Signal.Electromigration.in.NanoCMOS.pdf | 4.9 MB |
Author: Gracieli Posser, Sachin S. Sapatnekar, Ricardo Reis
Edition: 1st ed. 2017 edition
Publication Date: November 30, 2016
Publisher: Springer
ISBN-10: 3319488988
ISBN-13: 978-3319488981
Pages: 118 pages
Format: pdf
Size: 5.0M
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This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for the electromigration effects inside logic cells of a circuit.
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http://dlfeb.com/book/electromigration-inside-logic-cells-modeling-analyzing-and-mitigating-signal-electromigration-in-nanocmos/
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